VDB
CVE-2019-20607
CVE-2019-20607
PUBLISHED
CVSS 9.800000190734863 CRITICAL
An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).
EPSS 0.88% · 57.6th percentile
Risk Scores
CVSS 3.1
9.800000190734863
CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
EPSS Score
0.88%
57.6th percentile
Affected Products
| Vendor | Product | Versions |
|---|---|---|
| android | 7.0, 7.1.0, 8.0 | |
| n/a | n/a | * |
Timeline
- Mar 24, 2020 CVE Published
- Apr 14, 2021 EPSS Score
- Jun 23, 2021 EPSS Score
- Aug 25, 2021 EPSS Score
- Dec 29, 2021 EPSS Score
- Jan 6, 2022 EPSS Score
- Feb 4, 2022 EPSS Score
- Mar 2, 2022 EPSS Score
- Apr 1, 2022 EPSS Score
- May 4, 2022 EPSS Score
- Sep 8, 2022 EPSS Score
- Nov 10, 2022 EPSS Score